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klipper/test/klippy
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Kevin O'Connor 20df766e21 probe_eddy_current: Rename config option z_offset to descend_z 
The config option 'z_offset' name is confusing as its behavior is
notably different from how other probe hardware uses 'z_offset'.
Rename to 'descend_z' to make its behavior more clear.

Signed-off-by: Kevin O'Connor <kevin@koconnor.net>
2026-03-24 13:07:19 -04:00
..
sdcard_loop
loop_sdcard: Add loopable SD card file sections
2021-05-26 11:57:57 -04:00
bed_mesh.cfg
test: Add a bed_mesh test case
2026-01-26 18:40:48 -05:00
bed_mesh.test
test: Add a bed_mesh test case
2026-01-26 18:40:48 -05:00
bed_screws.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
bed_screws.test
test: Rename atmega2560-16mhz.config to atmega2560.config
2019-03-22 12:36:18 -04:00
bltouch.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
bltouch.test
test: Rename atmega2560-16mhz.config to atmega2560.config
2019-03-22 12:36:18 -04:00
commands.test
toolhead: Remove support for max_accel_to_decel
2025-08-11 19:14:37 -04:00
corexyuv.cfg
generic_cartesian: Full IQEX printers support (#7165)
2026-02-04 16:54:05 -05:00
corexyuv.test
generic_cartesian: Added option 'axis' for primary carriages
2025-11-25 18:12:43 -05:00
delta_calibrate.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
delta_calibrate.test
test: Add new delta_calibrate test case
2019-12-05 14:48:52 -05:00
delta.test
test: Rename atmega2560-16mhz.config to atmega2560.config
2019-03-22 12:36:18 -04:00
dual_carriage.cfg
dual_carriage: Fixed broken safe_distance parameter
2025-05-07 14:23:39 -04:00
dual_carriage.test
idex_modes: Improved restoring position in RESTORE_DUAL_CARRIAGE_STATE
2024-08-03 14:40:52 -04:00
eddy.cfg
probe_eddy_current: Rename config option z_offset to descend_z
2026-03-24 13:07:19 -04:00
eddy.test
probe_eddy_current: implement tap support
2026-01-29 20:57:55 -05:00
exclude_object.cfg
exclude_objects: initial implementation
2022-06-03 14:12:04 -04:00
exclude_object.test
exclude_objects: initial implementation
2022-06-03 14:12:04 -04:00
extruders.cfg
filament_motion_sensor: define tests
2025-09-04 14:20:25 -04:00
extruders.test
extruder: Add new SYNC_EXTRUDER_MOTION command
2022-02-10 13:24:21 -05:00
gcode_arcs.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
gcode_arcs.test
gcode_arcs: Allow either one of I, J, K to be default-zero on G2/G3 (#5939)
2022-12-14 12:06:11 -05:00
generic_cartesian_iqex.cfg
dual_carriage: Allow dual carriage inactivation
2026-02-19 21:37:18 -05:00
generic_cartesian_iqex.test
dual_carriage: Allow dual carriage inactivation
2026-02-19 21:37:18 -05:00
generic_cartesian_itex.cfg
generic_cartesian: Full IQEX printers support (#7165)
2026-02-04 16:54:05 -05:00
generic_cartesian_itex.test
generic_cartesian: Full IQEX printers support (#7165)
2026-02-04 16:54:05 -05:00
generic_cartesian.cfg
generic_cartesian: Added option 'axis' for primary carriages
2025-11-25 18:12:43 -05:00
generic_cartesian.test
generic_cartesian: Added option 'axis' for primary carriages
2025-11-25 18:12:43 -05:00
hybrid_corexy_dual_carriage.cfg
test: Regression test for hybrid corexy input shaping with dual carriage
2023-06-06 20:17:49 -04:00
hybrid_corexy_dual_carriage.test
test: Regression test for hybrid corexy input shaping with dual carriage
2023-06-06 20:17:49 -04:00
input_shaper.cfg
resonance_tester: Support testing resonances over Z axis
2025-10-04 19:50:34 -04:00
input_shaper.test
input_shaper: Limit maximum damping_ratio of the shapers
2025-10-04 13:07:49 -04:00
led.cfg
pca9632: Remove custom software i2c - use normal mcu software i2c instead
2025-07-22 14:04:50 -04:00
led.test
test: Add an led test for led, neopixel, dotstar, pca9533, pca9632 configs
2022-03-31 13:08:12 -04:00
linuxtest.cfg
linuxtest: Add a test case for the ds18b20 sensor
2022-06-08 18:06:12 -04:00
linuxtest.test
linuxtest: Add a test case for the ds18b20 sensor
2022-06-08 18:06:12 -04:00
load_cell.cfg
load_cell_probe: Enhance regression test case
2026-01-21 12:06:27 -05:00
load_cell.test
load_cell_probe: Enhance regression test case
2026-01-21 12:06:27 -05:00
macros.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
macros.test
test: Add a macros.test test case for testing gcode_macro
2019-06-04 09:50:30 -04:00
manual_stepper.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
manual_stepper.test
gcode_move: Fix M114 when extra axes are defined
2025-08-31 12:19:43 -04:00
move.gcode
winch: Add experimental support for cable winch kinematics
2018-12-24 11:38:59 -05:00
multi_z.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
multi_z.test
test: Rename atmega2560-16mhz.config to atmega2560.config
2019-03-22 12:36:18 -04:00
out_of_bounds.test
docs: Move config reference information to new Config_Reference.md
2020-11-18 20:10:21 -05:00
polar.test
polar: Add initial support for multiple bed rotations
2019-06-28 10:00:40 -04:00
pressure_advance.cfg
extruder: Allow dynamic adjustment of pressure advance (#6635)
2024-07-11 14:43:21 -04:00
pressure_advance.test
extruder: Allow dynamic adjustment of pressure advance (#6635)
2024-07-11 14:43:21 -04:00
printers.test
config: Config for Geeetech A-series printers: A10/M/T and A20/M/T (#6767)
2025-01-03 09:32:07 -05:00
pwm.cfg
pwm_cycle_time: New module for output pins with dynamic cycle times
2024-01-23 20:04:03 -05:00
pwm.test
pwm_cycle_time: New module for output pins with dynamic cycle times
2024-01-23 20:04:03 -05:00
quad_gantry_level.test
test: Flush moves in quad_gantry_level and z_tilt_adjust tests
2019-06-12 15:36:32 -04:00
rotary_delta_calibrate.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
rotary_delta_calibrate.test
rotary_delta: Initial support for rotary delta kinematics
2020-01-06 11:52:42 -05:00
screws_tilt_adjust.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
screws_tilt_adjust.test
screws_tilt_adjust: Add MAX_DEVIATION parameter for bed level invariant.
2021-04-28 11:53:18 -04:00
sdcard_loop.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
sdcard_loop.test
loop_sdcard: Add loopable SD card file sections
2021-05-26 11:57:57 -04:00
temperature.cfg
temperature_combined: A class that can combine several other temperature sensors (#6230)
2023-08-01 13:18:03 -04:00
temperature.test
test: Rename atmega2560-16mhz.config to atmega2560.config
2019-03-22 12:36:18 -04:00
tmc.cfg
tmc2240: initial implementation
2023-03-01 20:43:53 -05:00
tmc.test
tmc2240: initial implementation
2023-03-01 20:43:53 -05:00
z_tilt.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
z_tilt.test
test: Flush moves in quad_gantry_level and z_tilt_adjust tests
2019-06-12 15:36:32 -04:00
z_virtual_endstop.cfg
test: Update test case to not use pin_map
2021-10-24 21:11:53 -04:00
z_virtual_endstop.test
test: Rename atmega2560-16mhz.config to atmega2560.config
2019-03-22 12:36:18 -04:00